5 results
High-resolution TEM and diffraction study of layer stacking and long-period undulations in the incommensurate misfit layer compound (PbS)1.14NbS2
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 424-425
- Print publication:
- September 2007
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Tem/Hrem Analysis of Defects in GaN Epitaxial Layers Grown by MOVPE on SiC and Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 468 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 287
- Print publication:
- 1997
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Formation and Properties of Porous Si Superlattices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 327
- Print publication:
- 1994
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Reduction of Misfit Dislocation Density in Finite Lateral Size Sil-xGex Films Grown by Selective Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 45
- Print publication:
- 1993
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Formation of Heterogeneous Thickness Modulations During Epitaxial Growth of LPCVD-Si1−xGex/Si Quantum Well Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 23
- Print publication:
- 1992
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